The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Dec. 07, 2023
Applicant:

Endress+hauser Optical Analysis, Inc., Ann Arbor, MI (US);

Inventors:

Xiang Liu, Rancho Cucamonga, CA (US);

Kuan-Ting Yeh, Rancho Cucamonga, CA (US);

Chih-Husan Chang, Rancho Cucamonga, CA (US);

Utsav Kc, Rancho Cucamonga, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G01N 21/03 (2006.01); G01N 21/05 (2006.01); G01N 21/17 (2006.01); G01N 21/27 (2006.01); G01N 21/33 (2006.01); G01N 21/35 (2014.01); G01N 21/39 (2006.01); G01N 21/65 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3103 (2013.01); G01N 21/274 (2013.01); G01N 21/031 (2013.01); G01N 21/05 (2013.01); G01N 2021/1704 (2013.01); G01N 21/27 (2013.01); G01N 21/33 (2013.01); G01N 2021/3595 (2013.01); G01N 21/39 (2013.01); G01N 2021/391 (2013.01); G01N 2021/399 (2013.01); G01N 21/65 (2013.01); G01N 2201/129 (2013.01); G01N 2201/1296 (2013.01); G06F 17/18 (2013.01);
Abstract

A method of spectroscopic analysis includes: collecting a set of calibration spectra for calibration gas samples by scanning a sample range of wavelengths; calculating a first concentration of a target analyte and first concentrations of background components for each calibration spectrum using a multivariant algorithm; modeling an ideal concentration of the target analyte as a function of the first concentrations using a correlative model; collecting a field spectrum for an unknown field gas sample, wherein the field gas sample includes the target analyte and at least some of the background components; calculating a second concentration of the target analyte and second concentrations the background components for the field spectrum using the multivariant algorithm; correcting the second concentration of the target analyte using the correlative model and second concentrations of the background components; and determining a corrected target analyte concentration in the field gas sample based on the corrected second concentration.


Find Patent Forward Citations

Liu, Xiang. (2026). Quantification of target analyte based on multi-layer multi-variant spectra analysis for spectroscopic analyzers (U.S. Patent No. 12546709). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12546709

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…