The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Dec. 27, 2021
Technion Research & Development Foundation Limited, Haifa, IL;
Forschungsverbund Berlin E.v., Berlin, DE;
Ofer Neufeld, Haifa, IL;
David Ayuso, Berlin, DE;
Gavriel Lerner, Haifa, IL;
Dana Raluca Cireasa, Haifa, IL;
Mikhail Ivanov, Berlin, DE;
Olga Smirnova, Berlin, DE;
Oren Cohen, Haifa, IL;
TECHNION RESEARCH & DEVELOPMENT FOUNDATION LIMITED, Haifa, IL;
FORSCHUNGSVERBUND BERLIN E.V., Berlin, DE;
Abstract
Methods and systems for detecting chiral characteristic of an analyte, are provided. In some embodiments, the method disclosed herein (e.g. operated by a system) comprises receiving at least one spectral line of harmonic emission generated by an interaction between a laser field and the analyte; measuring a characteristic of an electric field of the at least one spectral line resulting from an electric dipole interaction between the laser field and the analyte; and determining the chiral characteristic of said analyte based on said measured characteristics of the at least one spectral line.