The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Jul. 09, 2021
Applicant:

Arkema France, Colombes, FR;

Inventors:

Henri-Alexandre Cayzac, Serquigny, FR;

Jérôme Pascal, Serquigny, FR;

Régis Cipriani, Serquigny, FR;

Assignee:

ARKEMA FRANCE, Puteaux, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/08 (2006.01); B29C 70/06 (2006.01); B29C 70/44 (2006.01); B29C 70/54 (2006.01); B29K 101/12 (2006.01); B29K 307/04 (2006.01); B29K 309/08 (2006.01);
U.S. Cl.
CPC ...
G01N 3/08 (2013.01); B29C 70/06 (2013.01); B29C 70/44 (2013.01); B29C 70/54 (2013.01); B29K 2101/12 (2013.01); B29K 2307/04 (2013.01); B29K 2309/08 (2013.01); G01N 2203/0092 (2013.01); G01N 2203/0096 (2013.01); G01N 2291/0231 (2013.01);
Abstract

A method for analyzing semifinished products including reinforcing fibers having an essentially unidirectional orientation and a thermoplastic resin, including a first and a second test for measuring the thickness of a stack of semifinished products over time during the compression thereof and for determining the equivalent homogeneous viscosity of the stack; determining the total thickness reduction of the stack of semifinished products during the first test; determining the ratio of the equivalent homogeneous viscosity of the stack from the second test to the equivalent homogeneous viscosity of the stack from the first test; and determining the ratio of the thickness of the stack from the first test after a reference time starting from the moment of the onset of melting of the stack of semifinished products, to the thickness of the stack from the first test at the moment of the onset of melting of the stack of semifinished products.


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