The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Mar. 29, 2022
Applicant:

The Research Foundation for the State University of New York, Albany, NY (US);

Inventors:

Fatemeh Shahedipour-Sandvik, Niskayuna, NY (US);

Vincent Meyers, Albany, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/44 (2006.01); G05D 23/19 (2006.01); G05D 23/27 (2006.01); H05B 6/64 (2006.01); H05B 6/80 (2006.01);
U.S. Cl.
CPC ...
G01N 1/44 (2013.01); G05D 23/19 (2013.01); G05D 23/27 (2013.01); H05B 6/645 (2013.01); H05B 6/80 (2013.01); H05B 6/806 (2013.01);
Abstract

A system and method for annealing samples. The system includes a thermal shielding enclosure including a cavity, with a first surface, a second surface, a microwave emitter, a sensor and a control system. Additionally, the control system can adjust operational characteristics of the microwave emitter in response to determining whether the measured temperature of the sample is equal to or greater than a first predetermined temperature of the sample or is equal to or less than a second predetermined temperature of the sample.


Find Patent Forward Citations

Shahedipour-Sandvik, Fatemeh. (2026). Systems and methods for annealing samples (U.S. Patent No. 12546690). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12546690

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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