The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Mar. 23, 2023
Applicant:

Alcon Inc., Fribourg, CH;

Inventors:

Niyazi Tekeli, Eschau, DE;

Susanne Fechner, Aschaffenburg, DE;

Assignee:

Alcon Inc., Fribourg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/02 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0221 (2013.01);
Abstract

A method for optically inspecting an ophthalmic lens in an automated lens production process to determine an orientation state and an inversion state of the ophthalmic lens. The method comprises the steps of acquiring an image of the ophthalmic lens, determining from the acquired image an orientation value of the lens, comparing the determined orientation value with an orientation threshold value, and determining that the lens is oriented right side up when the determined orientation value is higher than the orientation threshold value, or determining that the lens is oriented upside down when the determined orientation value is lower than the orientation threshold value, or vice versa.


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