The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Mar. 13, 2013
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventor:
Henry L. Edwards, Garland, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 7/02 (2021.01); H01L 21/66 (2006.01); H01L 23/34 (2006.01); H01L 23/38 (2006.01); H10N 19/00 (2023.01);
U.S. Cl.
CPC ...
G01K 7/02 (2013.01); H01L 22/34 (2013.01); H01L 23/345 (2013.01); H01L 23/38 (2013.01); H10N 19/00 (2023.02); H01L 2924/0002 (2013.01);
Abstract
An integrated circuit containing an embedded resistor in close proximity to an embedded thermoelectric device. An integrated circuit containing an embedded resistor in close proximity to an embedded thermoelectric device composed of thermoelectric elements and at least one switch to disconnect at least one thermoelectric element from the thermoelectric device. Methods for testing embedded thermoelectric devices.
Edwards, Henry. (2026). Apparatus and method to test embedded thermoelectric devices (U.S. Patent No. 12546666). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12546666
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile