The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Dec. 16, 2021
Applicant:

Jade Bird Display (Shanghai) Limited, Shanghai, CN;

Inventors:

Chenchao Xu, Shanghai, CN;

Yang Yue, Shanghai, CN;

Qiming Li, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/04 (2006.01);
U.S. Cl.
CPC ...
G01J 1/0422 (2013.01); G01J 1/0403 (2013.01);
Abstract

An inspecting tool for inspecting a micro LED array panel () comprises: an optical collector group () configured to collect light emitted from a micro LED array included in the micro LED array panel (): an image detector () connected with the optical collector group () to receive the light collected by the optical collector group () and to capture an image of the micro LED array: and. a light measuring device () electrically connected with the optical collector group () to receive the light collected by the optical collector group () and to measure the light emitted from one or more portions of the micro LED array. The optical collector group () comprises a first optical collector () connected with the image detector () and a second optical collector () electrically connected with the light measuring device (); the first optical collector () and the second optical collector () are configured on a fixture element (); and, the fixture element () is rotatable at any direction. This inspecting tool can increase the image accuracy.


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