The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

May. 05, 2022
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Fei Tang, Aarau, CH;

Bala Divakaruni, Chicago, IL (US);

Ole Henry Dorum, Chicago, IL (US);

Assignee:

HERE GLOBAL B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 21/00 (2006.01); G06T 11/00 (2006.01); G06V 20/10 (2022.01);
U.S. Cl.
CPC ...
G01C 21/3859 (2020.08); G01C 21/3841 (2020.08); G01C 21/3889 (2020.08); G06T 11/00 (2013.01); G06V 20/182 (2022.01);
Abstract

A method is provided for generation of map geometry through rasterization of probe data over time, where the generated map geometry can be used for map element generation. Methods may include: receiving probe data from a plurality of probe apparatuses within a geographic area where the probe data includes location information and time information; rasterizing the received probe data to generate an image corresponding to the probe data associated with the geographic area, where each pixel of the image includes a property representing at least one component of the probe data; processing the image to obtain one or more map elements; and updating a map database with the one or more map elements.


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