The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Jun. 22, 2022
Duke University, Durham, NC (US);
Joseph A. Izatt, Durham, NC (US);
Al-Hafeez Z. Dhalla, Durham, NC (US);
Jingkai Zhang, Durham, NC (US);
DUKE UNIVERSITY, Durham, NC (US);
Abstract
A method of rapid coherent synthetic wavelength interferometric absolute distance measurement includes receiving, from an optical system, an image from an object scene of at least two distinct wavelengths of light, each wavelength's light source having a coherence length greater than a desired ambiguity length of the absolute distance measurement, and whose synthetic wavelength in combination provides the desired ambiguity length of the absolute distance measurement. A phase-based approach, a magnitude-based approach, or an envelope of the magnitude-based approach can be taken to determine an interference between light returning from the object scene and light traversing a separate reference arm path of the optical system and calculate an optical distance to an object in the object scene.