The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Mar. 05, 2020
Applicant:
Yikon Genomics (Suzhou) Co., Ltd., Suzhou, CN;
Inventors:
Chunxu Hu, Suzhou, CN;
Yanping Li, Suzhou, CN;
Xin Dong, Suzhou, CN;
Sijia Lu, Suzhou, CN;
Mintao Hu, Suzhou, CN;
Assignee:
YIKON GENOMICS (SUZHOU) CO., LTD., Suzhou, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/6876 (2018.01); G16B 25/10 (2019.01);
U.S. Cl.
CPC ...
C12Q 1/6876 (2013.01); G16B 25/10 (2019.02); C12Q 2600/158 (2013.01); G01N 2800/367 (2013.01);
Abstract
The present invention provides a method for determining endometrial receptivity and an application thereof. Specifically, the present invention provides a method for determining endometrial receptivity and markers for determining an endometrial receptivity status. The markers of the present invention could greatly reduce the error rate during the determination of the endometrial receptivity.
Hu, Chunxu. (2026). Method of determining endometrial receptivity and application thereof (U.S. Patent No. 12545957). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12545957
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile