The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Oct. 26, 2020
Applicant:

Daicel Corporation, Osaka, JP;

Inventor:

Daisuke Ito, Tokyo, JP;

Assignee:

DAICEL CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C08F 22/40 (2006.01); C08K 5/14 (2006.01); C08L 35/00 (2006.01); C09D 135/00 (2006.01); C09J 135/00 (2006.01);
U.S. Cl.
CPC ...
C08F 22/40 (2013.01); C08K 5/14 (2013.01); C08L 35/00 (2013.01); C09D 135/00 (2013.01); C09J 135/00 (2013.01);
Abstract

Provided is a curable composition having excellent workability and being capable of forming a cured product having super heat resistance by curing. The curable composition of the present disclosure includes a curable compound represented by Formula (1) below and a radical polymerization initiator. In the following formula, Rand Reach represent a curable functional group, and Dand Deach represent a single bond or a linking group. L represents a divalent group having a repeating unit containing a structure represented by Formula (I) below and a structure represented by Formula (II) below. Arto Areach represent an arylene group or a group in which two or more arylene groups are bonded via a single bond or a linking group. X represents —CO—, —S—, or —SO—, and Y represents —S—, —SO—, —O—, —CO—, —COO—, or —CONH—. n represents an integer of 0 or greater.


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