The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Dec. 20, 2022
Applicant:

Alltec Angewandte Laserlicht Technologie Gmbh, Selmsdorf, DE;

Inventor:

Stephan Dietrich, Alsbach-Hähnlein, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65B 57/10 (2006.01); B65B 9/04 (2006.01); G06T 7/00 (2017.01); G06T 7/90 (2017.01);
U.S. Cl.
CPC ...
B65B 57/10 (2013.01); B65B 9/045 (2013.01); G06T 7/001 (2013.01); G06T 7/90 (2017.01); G06T 2207/10024 (2013.01); G06T 2207/30108 (2013.01);
Abstract

There is provided a method for configuring an inspection system of a blister machine for producing blister packs comprising pharmaceutical products, the method comprising, obtaining, by the inspection system, an electronic reference comprising first data associated with a blister pack, analysing, by the inspection system, the electronic reference to extract the first data, obtaining, by the inspection system, a reference image comprising an image of a portion of an unsealed bottom film of the blister pack comprising one or more pockets in which pharmaceutical product is located, comparing, by the inspection system, the first data with the reference image, determining, by the inspection system and based on the comparing, second data associated with the pharmaceutical product, and generating, by the inspection system, reference data comprising the first data and the second data, the reference data for use by the inspection system to identify issues during operation of the blister machine.


Find Patent Forward Citations

Dietrich, Stephan. (2026). Inspection system for a blister machine (U.S. Patent No. 12545465). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12545465

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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