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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12545143 B1

PDFFull Text
Date of Patent:
Feb. 10, 2026

Filed:

Sep. 17, 2020

Abnormality detection system

Applicant:

Honda Motor Co., Ltd., Tokyo, JP;

Inventors:

Kentaro Sugimura, Wako, JP;

Shunichiro Sueyoshi, Wako, JP;

Tadashi Hayashida, Wako, JP;

Manato Kuwabara, Tokyo, JP;

Yusuke Nakajima, Tokyo, JP;

Assignee:

HONDA MOTOR CO., LTD., Tokyo, JP;

Attorney:

Rankin, Hill & Clark LLP

Primary Examiner:

Alexis B Pacheco

Int. Cl.
CPC ...
H02J 7/00 (2006.01); B60L 53/80 (2019.01); B60L 58/14 (2019.01); B60L 58/16 (2019.01); H02J 7/14 (2006.01);
U.S. Cl.
CPC ...
B60L 58/14 (2019.02); B60L 53/80 (2019.02); B60L 58/16 (2019.02); B60L 2240/549 (2013.01);
Abstract

An abnormality detection system includes a removable battery and a server. The removable battery has: a detector; a battery side acquisition unit for acquiring measured data that are the data of measured values measured by the detector and acquiring, from an object to be electrically driven, first recognition data for recognizing the object to be electrically driven; and a battery side storage unit. The server has: a server side storage unit for prestoring reference data that are the data acquired when the object to be electrically driven performs a predetermined operation; a server side acquisition unit for acquiring the measured data, the first recognition data, and second recognition data; and an abnormality detection unit for comparing actual work data obtained from the measured data with the reference data and detecting an abnormality when the difference between the actual work data and the reference data exceeds a threshold value.

Find Patent Forward Citations

Sugimura, Kentaro. (2026). Abnormality detection system (U.S. Patent No. 12545143). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12545143

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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