The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Oct. 04, 2023
Applicant:

Denso Corporation, Kariya, JP;

Inventors:

Shota Ishikawa, Kariya, JP;

Tomoaki Ozaki, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1666 (2013.01); B25J 9/1676 (2013.01); B25J 9/1679 (2013.01); G05B 2219/39091 (2013.01);
Abstract

An interference determination device includes a registration unit that registers a start point and an end point of a motion of a robot, an interference determination unit that determines whether the robot interferes with an obstacle when the robot moves along a path from the start point to the end point, and an interference determination condition registration unit that registers an interference determination condition including at least one of an interference allowable distance that allows the interference with the obstacle, a positional error that is included in a relative position between the robot and the obstacle when the relative position is grasped, and a synchronization time error when the obstacle is a movable object that moves along a predetermined path in synchronization with the motion of the robot. The interference determination unit determines whether the robot interferes with the obstacle in consideration of the interference determination condition.


Find Patent Forward Citations

Ishikawa, Shota. (2026). Interference determination device and path generation device (U.S. Patent No. 12544928). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12544928

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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