The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Feb. 26, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Hiroyuki Oyama, Tokyo, JP;

Rin Takano, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01);
U.S. Cl.
CPC ...
B25J 9/163 (2013.01); B25J 9/1666 (2013.01);
Abstract

A constraint condition learning deviceX mainly includes a conversion meansX and a constraint condition estimation meansX. The conversion meansX converts first time series data regarding a state and an input of a robot system during an execution period of a task executed by the robot system into second time series data represented by propositions. The constraint condition estimation meansX estimates a constraint condition on the task as a logical formula, based on the second time series data and the information regarding whether or not the task succeeded.


Find Patent Forward Citations

Oyama, Hiroyuki. (2026). Constraint condition learning device, constraint condition learning method, and storage medium (U.S. Patent No. 12544918). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12544918

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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