The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Aug. 31, 2020
Applicant:
Topcon Corporation, Tokyo, JP;
Inventors:
Assignee:
TOPCON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/117 (2006.01); A61B 3/00 (2006.01); A61B 3/135 (2006.01); A61B 3/14 (2006.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
A61B 3/1176 (2013.01); A61B 3/0025 (2013.01); A61B 3/135 (2013.01); A61B 3/14 (2013.01); G06T 7/0012 (2013.01); G06T 7/0016 (2013.01); G06T 7/11 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/30041 (2013.01);
Abstract
A slit lamp microscope of an aspect example includes a scanner and a data processor. The scanner is configured to scan an anterior segment of a subject's eye with slit light to collect a plurality of cross sectional images. The data processor is configured to generate opacity distribution information that represents a distribution of an opaque area in a crystalline lens, based on the plurality of cross sectional images collected by the scanner.