The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2026

Filed:

May. 13, 2021
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Shimpei Ogawa, Tokyo, JP;

Masaaki Shimatani, Tokyo, JP;

Shoichiro Fukushima, Tokyo, JP;

Satoshi Okuda, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10F 77/40 (2025.01); G01N 21/27 (2006.01); H10F 30/222 (2025.01); G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
H10F 77/413 (2025.01); G01N 21/27 (2013.01); H10F 30/222 (2025.01); G01N 2021/258 (2013.01);
Abstract

An electromagnetic wave detector includes at least one photoelectric conversion element and a plasmon filter disposed so as to be opposite to the at least one photoelectric conversion element. A plurality of through-holes are periodically made in the plasmon filter. The at least one photoelectric conversion element includes a semiconductor layer including a region overlapping with at least one through-hole in the plurality of through-holes in planar view, an insulating layer formed so as to cover a part of the region, a two-dimensional material layer that is disposed on the other portion of the region and the insulating layer and electrically connected to the other portion of the region, a first electrode portion electrically connected to the two-dimensional material layer, and a second electrode portion electrically connected to the semiconductor layer.


Find Patent Forward Citations

Ogawa, Shimpei. (2026). Electromagnetic wave detector including a photoelectric conversion element and a plasmon filter, and electromagnetic wave detector array (U.S. Patent No. 12543402). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12543402

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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