The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2026

Filed:

Mar. 15, 2024
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Jin Ho Lee, Daejeon-si, KR;

Hui Yong Kim, Daejeon-si, KR;

Sung Chang Lim, Daejeon-si, KR;

Jong Ho Kim, Daejeon-si, KR;

Ha Hyun Lee, Seoul, KR;

Jin Soo Choi, Daejeon-si, KR;

Jin Woong Kim, Daejeon-si, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/593 (2014.01);
U.S. Cl.
CPC ...
H04N 19/593 (2014.11);
Abstract

The multi sample prediction method of the present invention comprises the steps of: determining a sample group consisting of a plurality of samples inside a decoding target block; determining a representative position corresponding to the sample group, inside the decoding target block; determining a representative prediction value for the sample group, on the basis of the determined representative position; and determining the determined representative prediction value as the final prediction value for each of the plurality of samples making up the sample group. The present invention enhances efficiency in encoding/decoding and reduces complexity thereof.


Find Patent Forward Citations

Lee, Jin. (2026). Method and device for intra-prediction (U.S. Patent No. 12542925). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12542925

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