The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2026

Filed:

Jun. 22, 2022
Applicant:

Bae Systems Plc, London, GB;

Inventors:

Colin Richard Mills, Rochester, GB;

Richard David Harriss, Rochester, GB;

Assignee:

BAE SYSTEMS PLC, London, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 25/68 (2023.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); H04N 25/68 (2023.01);
Abstract

An integrity monitor for monitoring integrity of image sensor data. The integrity monitor comprises an image sensor configured to generate image sensor data, wherein the image sensor data includes an image representative of a scene and a plurality of optically dark pixels in a predetermined position relative to the image. The integrity monitor further comprises a controller configured to: analyse () one or more characteristics of at least one of the plurality of optically dark pixels; and determine () a presence of a fault in the image sensor data based at least in part on the one or more characteristics of the at least one of the plurality of the optically dark pixels to be output to enable mitigation of the fault.


Find Patent Forward Citations

Mills, Colin. (2026). Integrity monitoring of image sensor data (U.S. Patent No. 12542892). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12542892

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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