The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2026

Filed:

Jun. 11, 2020
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Huilin Xu, Temecula, CA (US);

Qunfeng He, San Diego, CA (US);

Yuwei Ren, Beijing, CN;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/336 (2015.01); H04W 24/10 (2009.01); H04W 56/00 (2009.01);
U.S. Cl.
CPC ...
H04B 17/336 (2015.01); H04W 24/10 (2013.01); H04W 56/0015 (2013.01);
Abstract

Methods, systems, and devices for wireless communications are described. Generally, a base station may configure one or more cross-link interference measurement resources on which a user equipment (UE) is to measure CLI. The UE may measure CLI from a single aggressor UE in multiple receive directions. The UE may identify receive beams on which it receives other signal types, and use those receive beams to measure CLI. In some examples, the base station may explicitly indicate to the UE which receive beams it is to use for CLI measurements. The UE may measure CLI on each CLI measurement resource using the identified receive beam, and may transmit, to the base station, a CLI report including CLI measurements, an indication of resource on which CLI measurements were taken, or a combination thereof.


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