The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2026

Filed:

Aug. 18, 2021
Applicant:

Horiba, Ltd., Kyoto, JP;

Inventors:

Hiroyuki Ikeda, Kyoto, JP;

Tatsuya Yoshimura, Kyoto, JP;

Assignee:

HORIBA, LTD., , JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G07C 5/02 (2006.01); B60W 60/00 (2020.01); G01M 15/10 (2006.01); G06F 30/20 (2020.01); G07C 5/08 (2006.01);
U.S. Cl.
CPC ...
G07C 5/02 (2013.01); G01M 15/10 (2013.01); G06F 30/20 (2020.01); G07C 5/0808 (2013.01); B60W 60/00 (2020.02);
Abstract

A test system for testing a test piece that is a vehicle or a part of the vehicle including a sensor and an electronic control device including a vehicle diagnostic function that acquires an output signal from the sensor, and that makes a diagnosis of the vehicle or the part of the vehicle, the test system includes a simulation signal generation device that is provided on a line between the sensor and the electronic control device, and that outputs a simulation signal simulating an output signal from the sensor to the electronic control device, a control unit that controls the simulation signal generation device to generate a simulation signal, and a storage unit that stores therein the generated simulation signal and an output signal that is output from the electronic control device in response to an input of the simulation signal, in a manner associated with each other.


Find Patent Forward Citations

Ikeda, Hiroyuki. (2026). Test system, control device, test method, and test system program (U.S. Patent No. 12542012). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12542012

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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