The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2026

Filed:

Mar. 23, 2023
Applicant:

The Trustees of Columbia University IN the City of New York, New York, NY (US);

Inventors:

Samuel K. Sia, New York, NY (US);

Shih-Fu Chang, New York, NY (US);

Siddarth Arumugam, New York, NY (US);

Uzay Macar, New York, NY (US);

Jiawei MA, New York, NY (US);

Guangxing Han, New York, NY (US);

David Colburn, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/82 (2022.01); G06V 10/77 (2022.01);
U.S. Cl.
CPC ...
G06V 10/82 (2022.01); G06V 10/7715 (2022.01);
Abstract

A framework for a few-shot learning method is disclosed. In a first part, self-supervision and classification supervision are used to train a feature extractor. An example self-supervision method comprises running grayscale images through an edge filter, normalizing the filtered images, setting the normalized images to ground truth, generating feature-extracted images, using a decoder to reconstruct images from the feature-extracted images, determining a loss between the reconstructed images and the ground truth images, and using the loss to update parameters of the feature extractor. In a second part, a few-shot adaptation process is performed to adapt the model to a novel rapid test kit.


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