The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2026

Filed:

Dec. 28, 2023
Applicant:

Snap Inc., Santa Monica, CA (US);

Inventors:

Avihay Assouline, Tel Aviv, IL;

Amir Fruchtman, Holon, IL;

Jonathan Heimann, Herzliya, IL;

Nir Malbin, Shoham, IL;

Assignee:

Snap Inc., Santa Monica, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 19/00 (2011.01); G06T 5/50 (2006.01); G06T 5/77 (2024.01);
U.S. Cl.
CPC ...
G06T 19/006 (2013.01); G06T 5/50 (2013.01); G06T 5/77 (2024.01); G06T 2207/20221 (2013.01);
Abstract

Methods and systems are disclosed for using machine learning models to perform pixel-based deformation of fashion items. The methods and systems receive one or more images depicting a person in an individual pose and receive a first source image depicting a first view of a target fashion item and a second source image depicting a second view of the target fashion item. The methods and systems process, using one or more machine learning models, the one or more images that depict the person in the individual pose together with the first and second source images to generate a flow field, the flow field indicating a likelihood of existence and location of each pixel of the one or more images relative to the first and second source images. The methods and systems modify a portion of the one or more images to overlay the target fashion item on the person.


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