The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2026
Filed:
Mar. 03, 2021
Imagination Technologies Limited, Kings Langley, GB;
Gregory Clark, Hemel Hempstead, GB;
Steven J. Clohset, San Francisco, CA (US);
Luke T. Peterson, San Francisco, CA (US);
Naser Sedaghati, Columbus, OH (US);
Ali Rabbani, Nottingham, GB;
Imagination Technologies Limited, Kings Langley, GB;
Abstract
A ray-tracing system for performing intersection testing includes a tester module for testing rays for intersection with a volume, the tester module receiving a packet of one or more rays to be tested for intersection with the volume. A first set of one or more testers performs intersection testing at a first level of precision to provide intersection testing results, wherein for a first type of the intersection testing result from the first set of one or more testers intersection testing does not need to be reperformed at a second level of precision greater than the first level of precision, and for a second type of the intersection testing result from the first set of one or more testers intersection testing is to be reperformed at the second level of precision; and a second set of one or more testers configured to perform intersection testing at the second level of precision. The tester module allocates a ray from a received packet to one of the first set of testers for intersection testing at the first level of precision; identifies the type of an intersection testing result for the ray provided by one of the first set of testers to determine whether intersection testing for the ray is to be reperformed at the second level of precision. If it is determined that intersection testing for the ray is to be reperformed at the second level of precision, the ray is allocated to one of the second set of testers for intersection testing at the second level of precision.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile