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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12541869 B1

PDFFull Text
Date of Patent:
Feb. 03, 2026

Filed:

Feb. 23, 2022

Grain flake measurement system, grain flake measurement method, and grain flake collection, movement, and measurement system

Applicant:

Bunge SA, Geneva, CH;

Inventors:

Rafael Monteiro Veras, Florianópolis—SC, BR;

Artur Antonio Seibert, Florianópolis—SC, BR;

André Luís Molgaro, Florianópolis—SC, BR;

Flávio Gabriel Oliveira Barbosa, Florianópolis—SC, BR;

Carlos Fernando Oliveira Cabeça Neves, Florianópolis—SC, BR;

Renan Bonnard, Florianópolis—SC, BR;

Assignee:

BUNGE SA, Geneva, CH;

Attorney:

GrowIP Law Group LLC

Primary Examiner:

Gandhi Thirugnanam

Int. Cl.
CPC ...
G06T 7/60 (2017.01); G01N 1/14 (2006.01); G06T 7/11 (2017.01); G06T 7/12 (2017.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G01N 1/14 (2013.01); G06T 7/11 (2017.01); G06T 7/12 (2017.01); G01N 2001/1418 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30188 (2013.01);
Abstract

This invention describes a measurement system (), a measurement method, and a collection, movement, and measurement system for grains () run through a flaking process, in order to define the grain flake thickness. The grain flake measurement system comprises: an image collection device () configured to collect an image of one of the grain flakes; and an acquisition unit () configured to receive the of the collected grain flake image through the image collection device and perform a measurement of the grain flake thickness. The grain flake measurement method comprises the steps of: collecting () a grain flake image through an image collection device; and measuring () the grain flake thickness through the collected image. The grain flake collection, movement, and measurement system () comprises: a grain flake collection device (); a measurement device (); a movement and selection device (); an acquisition unit (); and a command unit ().

Find Patent Forward Citations

Monteiro Veras, Rafael. (2026). Grain flake measurement system, grain flake measurement method, and grain flake collection, movement, and measurement system (U.S. Patent No. 12541869). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12541869

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