The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2026

Filed:

Apr. 03, 2023
Applicant:

Araceli Biosciences Inc., Tigard, OR (US);

Inventor:

Shiou-Jyh Ja, Portland, OR (US);

Assignee:

ARACELI BIOSCIENCES INC., Tigard, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 7/36 (2021.01); G02B 21/16 (2006.01); G02B 21/18 (2006.01); G02B 21/24 (2006.01); G02B 21/36 (2006.01); G06T 7/00 (2017.01); G06T 7/80 (2017.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/362 (2013.01); G02B 21/16 (2013.01); G02B 21/18 (2013.01); G02B 21/244 (2013.01); G02B 21/367 (2013.01); G06T 7/0002 (2013.01); G06T 7/80 (2017.01); H04N 17/002 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10148 (2013.01); G06T 2207/30168 (2013.01);
Abstract

Methods and systems are provided for a microscope system. In one example, a method for image-based detection of optical alignment for the microscope system comprises acquiring a plurality of contrast samples of a field of view of a subject, determining a contrast distribution for a plurality of divided sub-regions for the field of view based on the plurality of contrast samples, and generating an amount of angular discrepancy based on an in-focus position derived from the contrast distribution for each of the plurality of divided sub-regions. In one example, the method further comprises adjusting the microscope system based on the amount of angular discrepancy.


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