The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2026

Filed:

Nov. 23, 2021
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Oliver Dölle, Erlangen, DE;

Thomas Schütz, Fürth, DE;

Arvid Amthor, Grabfeld OT Nordheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/50 (2020.01); G01R 19/25 (2006.01);
U.S. Cl.
CPC ...
G01R 31/50 (2020.01); G01R 19/2513 (2013.01);
Abstract

Various embodiments of the disclosure include methods for testing measuring devices n for resources of an energy system assigned to a common measuring device. The method may include: acquiring a measurement signal P(t) by way of each of the measuring devices n; acquiring a sum signal P(t) by way of the common measuring device; providing an objective function Z, which defines a difference between the acquired sum signal P(t) and a modeled sum signal {circumflex over (P)}(t), wherein the modeled sum signal {circumflex over (P)}(t) is formed by way of the acquired measurement signals P(t) and a respective scaling factor S; and computing the values of the scaling factors Sby extremizing the objective function Z. The test includes determining an error with one of the measuring devices n through a deviation of the computed value of the associated scaling factor Sfrom a value defined for the respective measuring device n.


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