The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2026

Filed:

Feb. 14, 2024
Applicant:

Ul Llc, Northbrook, IL (US);

Inventor:

Michael Howard Salee, Island Lake, IL (US);

Assignee:

UL LLC, Northbrook, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/327 (2006.01);
U.S. Cl.
CPC ...
G01R 31/327 (2013.01);
Abstract

An apparatus for testing a plurality of electrical switches including contacts to connect multiple sample switches to an input and an output. A power source is connected to the inputs of the sample switches, and other switches are connected to the outputs of the sample switches so that the sample switches may be selectively connected to either a make load or a break load to perform testing on the sample switches. The sample switches may further be made of silicon carbide MOSFETs that shutoff using a zero-crossing current sensing logic. The voltage at the sample switches may further be monitored by a universal voltage board configured to sense various alternating and direct current (AC or DC) voltages so that various types of sample switches may be tested.


Find Patent Forward Citations

Salee, Michael. (2026). Systems and methods for parallel electrical endurance testing of contacts (U.S. Patent No. 12540976). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12540976

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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