The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2026
Filed:
Sep. 21, 2023
Taibah University, Medina, SA;
Muhammad Amin, Madinah, SA;
Hattan F. Abutarboush, Madinah, SA;
Rashad Ramzan, Islamabad, PK;
Omar F. Siddiqui, Madinah, SA;
Aqsa Ehsan, Islamabad, PK;
Taibah University, Madinah, SA;
Abstract
Described herein is Complex Dielectric Constant Sensor (CDCS) incorporating microstrip based radial stub and open circuit stub pair structures that utilize interference coupling between degenerate EIT modes to detect CDC of sample-under-test (SUT). In at least one embodiment, CDCS generates two distinct EIT modes when sensor is unloaded. In at least one embodiment, coupling between resonator modes and interaction of electromagnetic fields with material is affected indicating presence of dielectric sample. In at least one embodiment, two EIT modes become degenerate, causing cancellation and suppressing transparency window when dielectric constant of SUT matches a specific value. In at least one embodiment, CDCS can detect slight changes in complex dielectric properties of SUT. In at least one embodiment, CDCS can characterize materials such as substrate samples based on their CDCs for design and characterization of microwave devices, antennas, and thin film devices.
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