The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2026

Filed:

Jul. 29, 2021
Applicant:

Topcon Corporation, Tokyo, JP;

Inventor:

Hisashi Tsukada, Hachioji, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/135 (2006.01); A61B 3/12 (2006.01); A61B 3/14 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
A61B 3/135 (2013.01); A61B 3/12 (2013.01); A61B 3/145 (2013.01); G02B 21/36 (2013.01);
Abstract

A slit lamp microscope of an embodiment includes an image acquiring unit, a memory, and a misalignment information acquiring processor. The image acquiring unit is configured to acquire an image by applying a scan with slit light to an anterior segment of a subject's eye. The memory stores a first image of the anterior segment and a second image that is acquired by follow-up photography performed by the image acquiring unit with reference to the first image. The misalignment information acquiring processor is configured to acquire misalignment information between the first image and the second image by analyzing the first image and the second image after the follow-up photography.


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