The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Oct. 18, 2021
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Gihyun Lee, Yongin-si, KR;

Suk Ki, Yongin-si, KR;

Songi Kim, Yongin-si, KR;

Yongjin Bae, Yongin-si, KR;

Jooheon Seon, Yongin-si, KR;

Juwon Lee, Yongin-si, KR;

Jinseok Choi, Yongin-si, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10K 59/88 (2023.01); H10K 59/80 (2023.01); H10K 71/10 (2023.01); H10K 71/40 (2023.01); H10K 59/12 (2023.01);
U.S. Cl.
CPC ...
H10K 59/88 (2023.02); H10K 59/80522 (2023.02); H10K 71/191 (2023.02); H10K 71/421 (2023.02); H10K 59/1201 (2023.02);
Abstract

An apparatus for manufacturing a display apparatus includes a movable portion to which a display substrate including a pattern part is attached, wherein the pattern part includes a dummy electrode and an organic functional layer covering the dummy electrode, a processor configured to cause a laser to irradiate the display substrate in a first irradiating process, a measurement unit configured to measure the display substrate to which the laser has irradiated in the first irradiating process, and a controller configured to receive data measured by the measurement unit and control the processor to cause the laser to irradiate the laser in a second irradiating process using at least one different parameter than what was used in the first irradiating process.


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