The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Sep. 14, 2023
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Seijiro Imai, Ibaraki, JP;

Takeshi Okada, Ibaraki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
H04N 1/00029 (2013.01); G06T 7/0002 (2013.01); H04N 1/00045 (2013.01); H04N 1/00082 (2013.01); G06T 2207/30144 (2013.01);
Abstract

The present invention provides an inspection system comprising a printing apparatus and an inspection apparatus that inspects a printed matter printed by the printing apparatus. The inspection apparatus obtains a scanned image by reading an image formed on the printed matter, diagnose the printing apparatus based on the scanned image, and in a case in which the printing apparatus is diagnosed as having a defect by the diagnosis, the inspection apparatus presents a countermeasure to be executed in the printing apparatus to resolve the defect. Then, in response to the execution of the countermeasure in the printing apparatus, the inspection apparatus allows an instruction to re-diagnose the printing apparatus to be accepted.


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