The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2026
Filed:
Jan. 07, 2023
Applicant:
National Instruments Corporation, Austin, TX (US);
Inventors:
Assignee:
NATIONAL INSTRUMENTS CORPORATION, Austin, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
H04B 17/0085 (2013.01); G01R 29/0892 (2013.01);
Abstract
A system and method for determining an error vector magnitude (EVM) of a polarized transmission from a device-under-test (DUT). A first signal transmitted by the DUT is received via a horizontally polarized receiver antenna, and a second signal transmitted by the DUT is received via a vertically polarized receiver antenna. The second signal is coherent with the first signal. The EVM is calculated based at least in part on the first signal and the second signal and a reference signal.