The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

May. 26, 2023
Applicant:

Honeywell International Inc., Charlotte, NC (US);

Inventors:

Benjamin H. Wolf, Leicester, GB;

Ronald Blewanus, Naaldwijk, NL;

Michael Barson, Nuneaton, GB;

Assignee:

Honeywell International Inc., Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 29/18 (2006.01); G08B 31/00 (2006.01);
U.S. Cl.
CPC ...
G08B 29/185 (2013.01); G08B 31/00 (2013.01);
Abstract

Devices, systems, and methods for generating an event device optimization analysis in an event system are described herein. In some examples, one or more embodiments include a computing device comprising a memory and a processor to execute instructions stored in the memory to receive building system information from a plurality of event devices of the event system in a facility, generate an event device optimization analysis via a machine-learning model using the building system information from the plurality of event devices, and cause the event device optimization analysis to be displayed via a user interface.


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