The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Aug. 16, 2023
Applicant:

Snap Inc., Santa Monica, CA (US);

Inventors:

Avihay Assouline, Tel Aviv, IL;

Amir Fruchtman, Holon, IL;

Jonathan Heimann, Herzliya, IL;

Nir Malbin, Shoham, IL;

Assignee:

Snap Inc., Santa Monica, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 19/00 (2011.01); G06T 5/50 (2006.01); G06T 19/20 (2011.01);
U.S. Cl.
CPC ...
G06T 19/006 (2013.01); G06T 5/50 (2013.01); G06T 19/20 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/30196 (2013.01); G06T 2219/2016 (2013.01);
Abstract

Methods and systems are disclosed for using machine learning models to perform pixel-based deformation of fashion items. The methods and systems receive one or more images depicting a first person in a first pose and receive a source image depicting a target fashion item worn on a portion of a body of a second person in a second pose. The methods and systems process, using one or more machine learning models, the one or more images together with the source image to generate a flow field indicating existence and location of each pixel of the one or more images in the source image and modify, based on the flow field, a portion of the one or more images to overlay the target fashion item on the first person including one or more portions of the target fashion item that extend beyond a body of the first person.


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