The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Feb. 15, 2024
Applicant:

U.s. Government As Represented BY the Secretary of the Army, Dover, NJ (US);

Inventors:

Ryan Decker, Lake Hopatcong, NJ (US);

Benjamin Abruzzo, Newark, NJ (US);

Ahmed Hassan, Boonton, NJ (US);

Mihaly Horvath, Montville, NJ (US);

Steven Manole, Great Meadows, NJ (US);

Arhum Mirza, Vernon, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G01C 11/02 (2006.01); G01C 25/00 (2006.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G01C 11/02 (2013.01); G01C 25/00 (2013.01); H04N 17/002 (2013.01); G06T 2207/10048 (2013.01);
Abstract

A method for spatial calibration of an infrared (IR) camera allows for a large calibration area thereby providing high fidelity results for accurate long-distance measurement. Halogen lamps capable of being surveyed are spread over a relatively wide area to serve as calibration points for the infrared camera. The halogen lamps provide a precise and symmetric signature suitable for mid-wave IR cameras. An accurate model is developed for the radial and tangential distortion of the camera system. Likewise, values for the intrinsic parameters (focal lengths and optional skew coefficient) are measured to improve real-world measurements made using images recorded from a calibrated camera system.


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