The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Aug. 31, 2022
Applicant:

Deere & Company, Moline, IL (US);

Inventors:

Michio Kise, Bondurant, IA (US);

Boyoon Jung, Long Beach, CA (US);

Cristian Dima, St. Ingbert / Rohrbach, DE;

Assignee:

Deere & Company, Moline, IL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 7/246 (2017.01);
U.S. Cl.
CPC ...
G06T 7/74 (2017.01); G06T 7/248 (2017.01); G06T 2207/10016 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30188 (2013.01); G06T 2207/30244 (2013.01);
Abstract

A method for identifying geometric parameters of a trench during a planting process. The method includes, providing image data of the trench from a camera to a computing device, the image data including more than one image, identifying at least one artifact in a first image and a second image of the image data, determining camera displacement between the first image and the second image, and applying the camera displacement and positioning of the at least one artifact to identify a geometric location of the at least one artifact identified in the first image and the second image.


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