The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Jul. 04, 2022
Applicant:

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventors:

Wan-Jhen Lee, New Taipei, TW;

Chin-Pin Kuo, New Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); G06T 7/13 (2017.01); G06T 7/529 (2017.01); G06T 7/593 (2017.01); G06T 7/90 (2017.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G06T 7/13 (2017.01); G06T 7/529 (2017.01); G06T 7/593 (2017.01); G06T 7/90 (2017.01); G06T 2207/10024 (2013.01);
Abstract

An image feature matching method is provided by the present disclosure. The method includes determining a first weak texture area of a first image and a second weak texture area of a second image based on an edge detection algorithm. First feature points of the first weak texture area and second feature points of the second weak texture area are extracted. The first feature points and the second feature points are matched by determining a target point for each of the first feature points from the second feature points. Once a position difference value between each first feature point and the corresponding target point is determined, a matching point for each first feature point is determined according to the position difference value between the each first feature point and the corresponding target point.


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