The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2026
Filed:
Apr. 08, 2021
Nec Corporation, Tokyo, JP;
Royston Rodrigues, Tokyo, JP;
Masahiro Tani, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A training apparatus () acquires a ground-view image (), an aerial-view image (), and alignment information (), and trains a discriminator () that extracts a plurality of partial aerial regions () from the aerial-view image () and determines that the ground-view image () matches the aerial-view image () when there is the partial aerial region () that matches the ground-view image (). The training apparatus () extracts a correctly-aligned partial aerial region () and a mis-aligned partial aerial region () from the aerial-view image (). The correctly-aligned partial aerial region () is indicated by the alignment information () and corresponds to the ground-view image (). The mis-aligned partial aerial region () partially overlaps the correctly-aligned partial aerial region (). The training apparatus () trains the discriminator () using both the correctly-aligned partial aerial region () and the mis-aligned partial aerial region () as positive examples.