The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2026
Filed:
Mar. 15, 2022
Koninklijke Philips N.v., Eindhoven, NL;
Richard Vdovjak, Waalre, NL;
Dimitrios Mavroeidis, Eindhoven, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The invention relates to a system () for detecting one or more abnormalities in an x-ray image using an image classifier and one or more feature extractors. An abnormality is indicative of a pathology, a disease or a clinical finding present in the x-ray image. The feature extractors extract respective image quality features from the x-ray image indicative of a suitability of the x-ray image for detection of the abnormalities. The one or more feature extractors are applied to the x-ray image to determine the respective image quality features for the x-ray image. The image classifier is applied to the x-ray image to determine the classification scores for the one or more abnormalities. The image classifier has been trained to use the determined image quality features to determine said classification scores. A classification result is output based on the determined classification scores.