The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2026
Filed:
Jun. 06, 2022
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Yu-Hsuan Chien, New Taipei, TW;
Chin-Pin Kuo, New Taipei, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
An image detection obtains first images with defects. Each of the first images is corrected and divided to obtain first sub-region images. The first sub-region images are processed to obtain processed first sub-region images. The processed first sub-region images are used to train a neural network to obtain a target mode. Second images are obtained. Each of the second images is corrected and divided to obtain second sub-region images. The second sub-region images are processed to obtain processed second sub-region images. The target model is applied to detect each of the processed second sub-region images to obtain a detection result. The method can detect defects in images accurately and efficiently.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile