The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2026
Filed:
Jul. 10, 2020
Ntt, Inc., Tokyo, JP;
Yusuke Tanaka, Tokyo, JP;
Tomoharu Iwata, Tokyo, JP;
Takeshi Kurashima, Tokyo, JP;
Hiroyuki Toda, Tokyo, JP;
Toshiyuki Tanaka, Kyoto, JP;
NTT, Inc., Tokyo, JP;
Abstract
A parameter estimation sectionis configured to perform estimation, for aggregate data in which values are associated with respective regions obtained by subdividing a space and for a Gaussian process model that expresses a plurality of aggregate data of differing partition granularity. The estimation is performed based on the Gaussian process model including a spatial scale parameter of a correlation function between regions of the aggregate data and including a noise variance parameter of the correlation function, by estimating the spatial scale parameter and the noise variance parameter so as to maximize a function expressing values of the aggregate data by area integrals of a Gaussian process. A high resolution data computation sectionis configured to perform computation in the Gaussian process model including the estimated spatial scale parameter and noise variance parameter by computing high resolution data in which the resolution of the subject aggregate data is enhanced by taking area integrals of the values of the aggregate data subject to enhancement, by computation for each region obtained by subdividing the space at the granularity indicated by the target partition.