The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Jan. 19, 2024
Applicant:

Hand Held Products, Inc., Charlotte, NC (US);

Inventors:

Gourango Lal Biswas, Charlotte, NC (US);

Pankaj Kumar Pandey, Charlotte, NC (US);

Assignee:

Hand Held Products, Inc., Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 19/07 (2006.01); G06K 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 19/0723 (2013.01); G06K 7/0008 (2013.01);
Abstract

Methods, apparatuses and systems for an RFID system are disclosed herein. An example system may include one or more of antennas, each antenna including an RF power comparator for comparing the power level indicator of the RF signal of the antenna with an RF signal power threshold, a bias voltage comparator for comparing a bias voltage of the antenna with a bias voltage threshold, an RF fault bypass circuit functioning as an approximate open circuit when the bias voltage of the antenna is equal to or higher than the bias voltage threshold, and as an approximate short circuit when the bias voltage of the antenna is lower than the bias voltage threshold. The RFID system may include an RFID reading circuitry for determining a fault in the RFID system using any of the RF power comparison, bias voltage comparison, and function of the RF fault bypass circuit.


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Biswas, Gourango. (2026). Method and apparatus for fault diagnosis in an rfid system (U.S. Patent No. 12536398). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12536398

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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