The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Mar. 19, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Junpei Kamimura, Tokyo, JP;

Kazuhiko Isoyama, Tokyo, JP;

Yoshiaki Sakae, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 2221/034 (2013.01);
Abstract

An analysis condition for security risk for a data flow in a system to be analyzed is automatically generated. An analysis condition generating apparatusA generates from a natural sentence, using ontology in which a relationship is described between one or more nodes on a data flow graph that indicates a data flow in a system to be analyzed and one or more edges that indicate an event related to the nodes, graph structural data indicating the relationship between the nodes and the edges, and generates an analysis condition for analyzing security risk for the system to be analyzed based on the graph structural data.


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