The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Jun. 03, 2024
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Wei Cheng, Princeton Junction, NJ (US);

Xianjun Yang, Santa Barbara, CA (US);

Haifeng Chen, West Windsor, NJ (US);

Assignee:

NEC Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 11/362 (2025.01);
U.S. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 11/3624 (2013.01); G06F 2221/033 (2013.01);
Abstract

Systems and methods for detecting artificial intelligence (AI) generated computer code. Lines of code can be masked from a candidate code to obtain perturbed codes. Missing code can be generated from the perturbed codes by employing an AI code generator model to obtain machine-filled codes. Probabilities of the candidate code probability and the machine-filled codes as AI-generated can be predicted by employing a surrogate model. The candidate code can be distinguished as AI-generated by comparing the probabilities against a detection threshold to obtain detection results.


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