The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Feb. 15, 2021
Applicant:

Ntt, Inc., Tokyo, JP;

Inventors:

Sho Kanemaru, Musashino, JP;

Yukitsugu Sasaki, Musashino, JP;

Kensuke Takahashi, Musashino, JP;

Tsuyoshi Toyoshima, Musashino, JP;

Assignee:

NTT, Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/3668 (2025.01); G06F 9/54 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 9/541 (2013.01);
Abstract

A test code generation device includes an action generation unit that acquires at least one of pieces of API-related data of an API specification, an API execution order file, a parameter setting file, a script setting file, a test type, and a parameter list and generates action code data corresponding to an action of a state transition pattern of an API adapter, and the test code generation unit that generates a test code of the API adapter based on the action code data generated by the action generation unit and the state transition pattern of the API adapter.


Find Patent Forward Citations

Kanemaru, Sho. (2026). Test code generator, test code generation method, and, test code generation program (U.S. Patent No. 12536095). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12536095

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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