The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Jan. 18, 2023
Applicant:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Inventors:

Jared Richard, Fort Collins, CO (US);

Chris R. Jacobsen, Loveland, CO (US);

Gregory S. Hill, Santa Rosa, CA (US);

Assignee:

KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2221 (2013.01); G06F 11/2294 (2013.01);
Abstract

A system is proved for performing testing of devices under test (DUTs). The system includes edge sensors configured to collect measurement data from and to provide stimulus data to the DUTs for performing testing of the DUTs, where each edge sensor includes a data transducer and an intelligent network interface card configured to manage a transfer of the measurement data via a high-speed data network using remote direct memory access (RDMA); and a remote data center remote from the edge sensors, where the remote data center is scalable with respect to the number of edge sensors, and is configured to communicate with the edge sensors over the high-speed data network, where communicating with the edge sensors includes at least sending control signals for controlling the testing, receiving the measurement data, and/or sending the stimulus data.


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