The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Feb. 29, 2024
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Chark Wenshuai Yu, Shanghai, CN;

Lu Lei, Shanghai, CN;

Jiang Cao, Shanghai, CN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 11/141 (2013.01); G06F 11/1016 (2013.01);
Abstract

Data placement is adjusted. For instance, it is determined whether a node Failure To Tolerate (FTT) of a chunk in a storage system meets an optimized node FTT corresponding to the chunk, and, when it is determined that it does not meet, an FTT task entry for the chunk is added to a chunk index of the storage system. The added FTT task entry includes an identifier of the chunk, its node FTT, and the corresponding optimized system node FTT. Furthermore, instead of scanning placement information for each chunk, the storage system may adjust, based on the FTT task entry in the chunk index, placement of blocks of the corresponding chunk in system nodes. Therefore, the need to scan the placement information of all chunks and calculate their node FTTs in rebalance operations and minimum node FTT queries is eliminated, thereby improving the performance of the storage system.


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