The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2026
Filed:
Oct. 22, 2021
Massachusetts Institute of Technology, Cambridge, MA (US);
The Japan Steel Works, Ltd., Tokyo, JP;
Yip Fun Yeung, Cambridge, MA (US);
Ali Alshehri, Cambridge, MA (US);
Lois Wampler, Cambridge, MA (US);
Takayuki Hirano, Kashiwa, JP;
Mikio Furokawa, Higashi-Hiroshima, JP;
Kamal Youcef-Toumi, Cambridge, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
The Japan Steel Works, Ltd., Tokyo, JP;
Abstract
An anomalous scenario synthesizer apparatus includes a rotatable shaft configured to be rotationally driven about a rotation axis, a data acquisition system operably associated with the rotatable shaft and configured to measure attributes of the rotatable shaft, and a dynamic anomaly generator operably connected to the rotatable shaft. The dynamic anomaly generator is configured to generate at least one anomaly in the rotatable shaft while the rotatable shaft is rotating, and is configured to generate at least one dynamic label for each anomaly while the rotatable shaft is rotating. The dynamic label for each anomaly includes at least one descriptor corresponding to the anomaly that describes the anomaly such that a machine learning method may utilize the descriptor for machine learning.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile