The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2026
Filed:
Dec. 27, 2022
Siemens Schweiz Ag, Zurich, CH;
Jose Valenzuela Del Rio, Orlando, FL (US);
Heng Chi, Plainsboro, NJ (US);
Siemens Schweiz AG, Zurich, CH;
Abstract
Embodiments described below include a method for calibrating a digital twin, the digital twin being representative of a complex system governed by a set of parameters. The method includes receiving a subset of data from a plurality of sensors of the complex system then calculating an error that represents a difference in state between the digital twin and the complex system. In addition, a gradient of the calculated error is calculated and utilized to generate a set of candidate parameters for the complex system. The candidate parameters are generated using a gradient optimization. The candidate parameters are provided to the digital twin model and the error value is based on the candidate parameters. Steps may be repeated iteratively including calculating of the error and its gradient, generating of the candidate parameters, and applying the candidate parameter to the digital twin until the calculated error is smaller than a user-defined tolerance.